SEM Hitachi S-4700 more info:Hitachi S-4700 分類: SEM, 半導體設備 標籤: Hitachi, S-4700, SEM 描述 描述 Process: SEM Maker: Hitachi Model: S-4700 Description: Scanning Electron Microscope S/N: 0041-00 Vintage: 2011 Location: TW Scanning Electron Microscope Hitachi, Ltd. Tokyo Japan Made in Japan 相關商品 Litho exposure/半導體設備/BrukerBruker AXS’D8 FABLINE 查看內容 Litho exposure/半導體設備Scanner Nikon NSR S204B 查看內容 半導體設備/Wafer InspectWafer Loader-Nikon NWL860TMB+Nikon OPT2000 查看內容