SEM Hitachi S-4700 more info:Hitachi S-4700 Categories: SEM, 半導體設備 Tags: Hitachi, S-4700, SEM Description Description Process: SEM Maker: Hitachi Model: S-4700 Description: Scanning Electron Microscope S/N: 0041-00 Vintage: 2011 Location: TW Scanning Electron Microscope Hitachi, Ltd. Tokyo Japan Made in Japan Related products Sputter/半導體設備KDF 902ix SPUTTERING SYSTEM Read more 半導體設備/EtchevEtcher Branson IPC3000 Read more E-beam/半導體設備FULINTEC FU-16PEB-ITO Read more