描述
Atomic Force Microscopy
3D optical Microscopy
Tribology
Automatic AFM
Stylus profilometry
Mechanical Testing,
Nano Indentation.
BRUKER- Contour GT-K0
Atomic Force Microscopy
3D optical Microscopy
Tribology
Automatic AFM
Stylus profilometry
Mechanical Testing,
Nano Indentation.
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